BL13XU Nanodiffraction system
問い合わせ番号
INS-0000001628
Nanodiffraction system
◆Equipment overview
This equipment uses a Fresnel zone plate and compound refractive lenses as focusing elements to collect X-rays from 200 nm to 1 µm. These nanobeam X-rays are used in order to investigate local crystal strains and their distribution with high angular resolution.
◆Features of the Equipment
This equipment uses X-rays collected from 200 nm to 1 µm for X-ray diffraction measurements to investigate local strains and distributions of crystals. For the focusing elements, a Fresnel zone plate or refractive lenses can be selected according to the X-ray energy. The available X-ray energy ranges from 8-35 keV, with the beam size from 200 nm to 1 µm, and the beam intensity ranges up to approximately 109 - 1010 photon/sec. In addition, a high-sensitivity 2-dimensional detector has been developed for rapid reciprocal lattice mapping measurements.
Focusing optics
For X-rays less than 15 keV, a Fresnel zone plate is used, and for X-rays over 15 keV, compound refractive lenses are used. These focusing elements enable X-rays of 200 nm - 1 µm in the range of 8 - 35 keV to be collected.
Detector
The detector equipment prepared contains a hybrid multi-dimensional pixel detector HyPix-3000 (made by Rigaku Co), and a pixel detector TimePix (made by Amstredam Scientific Instruments). It also features X-ray fluorescence for sample positioning and elemental analysis with the use of an Si PIN detector XR-100CR and a CdTe detector XR-100CdTe.
Control Software
Software developed by LabView (made by National Instruments) is used to control the equipment. Measurements such as intensity distribution and reciprocal lattice map measurements are automated, and long-term, continuous measurements are possible by setting parameters.
◆Equipment accessories
The following accessories are available for these devices:
・X-ray chopper
By taking out the necessary periodic pulse X-rays in the experiment, it is possible to measure with the pump-probe method and the like.
・Diamond Phase Retarder
By rotating the incident polarized X-rays, X-rays with a scattering angle of around 90 degrees can be observed within the scattering arrangement in the horizontal plane.
◆Contact
Kazushi SUMITANI (sumitani@spring8.or.jp)
Yasuhiko IMAI (imai@spring8.or.jp)