大型放射光施設 SPring-8

問い合わせ番号

INS-0000001640

Diffraction measurement multi-purpose frame

  Diffraction measurement multi-purpose frame is a specially designed measurement system for in-situ observations of materials during manufacturing process or operando measurement of working devices. For this purpose, the system is designed to keep space around the sample as wide as possible. A large sample conditioning device can be established on the system which is difficult to mount on a traditional diffractometer, which enables us to use the same device in the laboratory or loading large device replicating manufacturing processes.
The measurement frame is composed of a sample stage with a hexapod and a robot arm. The sample stage has a rotational stage and hexapod which is used to align the sample orientation. A 2D detector is mounted on the robot arm to measure the distribution of the diffracted X-rays in the reciprocal space.
The user can carry their sample conditioning stage on the measurement frame for their beamtime. If you hope, please contact with the beamline staff before submitting your proposal.

◆Features of the Equipment

・Sample stage with a hexapod
The sample stage has a XZ translation stage for the stage alignment, a rotational stage (Huber 430) and a hexapod (PI H-850) for positioning the sample. The rotational stage can move around 360 degrees. The hexapod has moving directions as X, Y, Z, θx, θy, θz. The sample and conditioning stage is mounted on the hexapod.

・Robot arm for the detector
A 2D detector is mounted on the robot arm (Staubli TX2-160L). The motion of the robot arm is controlled by 6 axes. The load capacity and repeatability of the arm is 25 kg and +- 0.05 mm, respectively.
Camera distance: 0.01 ~ 1 m
Horizontal angle: +- 60 degrees
Vertical angle: 0 ~ 60 degrees

・Detectors
In this station, PILATUS 300K and 2M are available for the measurement. PILATUS 300K is mounted on the robot arm to measure the diffraction at the calculated position. PILATUS 2M is put on the special stand behind the sample to observe the diffraction at low scattering angle.

◆Contact

Kazushi Sumitani (sumitani@spring8.or.jp)