Various measurement with the PFY-XAFS(Partial Fluorescence Yield XAFS)
Inquiry number
SOL-0000001230
Beamline
BL15XU (RIKEN Materials Science III)
Scientific keywords
| A. Sample category | inorganic material |
|---|---|
| B. Sample category (detail) | metal, alloy, semiconductor, superconductor, magnetic material, ferroelectric material, insulator, ceramics, solid-state crystal, amorphous, glass |
| C. Technique | absorption and its secondary process, fluorescent X-rays |
| D. Technique (detail) | XAFS, EXAFS, XANES, trace-element |
| E. Particular condition | polarization (linear), polarization (circular), ultra-high vacuum, surface, interface, low-T (~ liquid N2) |
| F. Photon energy | intermediate (2-4 keV), X-ray (4-40 keV) |
| G. Target information | local structure, structural change |
Industrial keywords
| level 1---Application area | |
|---|---|
| level 2---Target | |
| level 3---Target (detail) | |
| level 4---Obtainable information | interatomic distance, local structure |
| level 5---Technique | XAFS |
Classification
M40.10 XAFS
Body text
PFY-XAFS (Partial Fluorescence Yield - XAFS)
Beside transmission mode XAFS from samples with well defined thickness and uniform composition, PFY-XAFS measurements can be performed using the X-ray Emission Double Crystal Spectrometer installed at BL15XU for a large variety of samples, both thick (bulk) and thin-films, interfaces, nano-scale crystals, dopants, or liquid samples, under both atmospheric and high vacuum conditions, at room temperature and low temperature conditions.
The high resolution of the double crystal x-ray emission spectrometer (typically dE/E ~ 104) allows to separate the in/elastic scattering of the incident beam from the detected signal, and record the XAFS features from the fluorescence signal of a specified emission line (Ka1, La1, Lb1, etc.)
- X-rays at sample
- ID helical :
- YB66 : 1.1 - 3.8 keV ; dE/E = 104 - 105
- Si111: 2.2 - 4.5 keV; dE/E = 104 - 105
- ID linear:
- Si111: 4.0 - 19.5 keV; dE/E = 104 - 105
- ID helical :
Source of the figure
No figure
Technique
PFY-XANES
Source of the figure
No figure
Required time for experimental setup
hour(s)
Instruments
| Instrument | Purpose | Performance |
|---|---|---|
| Double-crystal x-ray emission spectrometer |
References
Related experimental techniques
TFY-XAFS (total fluorescence yield)
TEY-XAFS (total electron yield )
Questionnaire
This solution is an application of a main instrument of the beamline.
Similar experiments account for more than 30% of the beamline's subject.
This solution is application of a new instrument installed in the past two years.
Ease of measurement
Easy
Ease of analysis
Middle
How many shifts were needed for taking whole data in the figure?
Two-three shifts