DVD XANES analysis by XPEEM with high energy X-ray
Inquiry number
SOL-0000004527
Beamline
BL15XU (RIKEN Materials Science III)
Scientific keywords
| A. Sample category | inorganic material, research on method, instrumentation |
|---|---|
| B. Sample category (detail) | semiconductor, solid-state crystal, amorphous, glass |
| C. Technique | photoemission, photoionization |
| D. Technique (detail) | PEEM |
| E. Particular condition | 2D imaging, X-ray microscopy, ultra-high vacuum, room temperature |
| F. Photon energy | X-ray (4-40 keV) |
| G. Target information | local structure, structural change, electronic state, phase transition |
Industrial keywords
| level 1---Application area | storage device |
|---|---|
| level 2---Target | CD-R、DVD |
| level 3---Target (detail) | |
| level 4---Obtainable information | crystal structure, local structure, electronic state |
| level 5---Technique | PEEM |
Classification
M50.20 PEEM
Body text
In this first solution, PEEM was applied to SbTe based DVD to analyze 2 dimensional images of recorded amorphous bit in crystalline base with high spatial resolution 30 nm. These data reveal the fact that PEEM can clarify the image contrast of recorded bit and reveal the difference of electronic structure between amorphous phase and crystalline phase by the measurement of XANES spectra at Sb L3 edge. Figure shows the DVD images (a) excited by ultra violet light and (b) 5keV SR light.
[ H. Yasufuku, H. Yoshikawa, M. Kimura, K. Ito, K. Tani and S. Fukushima, Surface and Interface Analysis 36, 892-895 (2004), Fig. 3,
©2004 Heydon & Son ]
Source of the figure
Original paper/Journal article
Journal title
Surface and Interface Analysis 36 (2004) 892–895
Figure No.
fig.3
Technique
High energy XPEEM is a powerful to evaluate the bulk sensitive chemical imaging.
Source of the figure
No figure
Required time for experimental setup
1 shift(s)
Instruments
| Instrument | Purpose | Performance |
|---|---|---|
| High energy XPEEM | bulk sensitive chemical imaging | maximum phoelectrons' energy 3keV |
References
| Document name |
|---|
| SURFACE AND INTERFACE ANALYSIS (2004) vol36, 892–895 |
Related experimental techniques
Questionnaire
The measurement was possible only in SPring-8. Impossible or very difficult in other facilities.
Ease of measurement
With a great skill
Ease of analysis
With a great skill
How many shifts were needed for taking whole data in the figure?
Less than one shift