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BL16B2 OUTLINE

Inquiry number

INS-0000000384

ABSTRACT

  This beamline, together with its sister beamline BL16XU, is a contract beamline designed and constructed by an industrial consortium of 13 companies to characterize various materials for industrial purpose. The main experiments on this beamline are XAFS, X-ray topography, X-ray imaging and X-ray diffraction. The energy range from the titanium K-edge to the thulium K-edge is covered. .

AREA OF RESEARCH

  • Characterization of various industrial materials for secondary batteries, fuel cells, catalysts, steels, semiconductors, optical and magnetic devices and others.

KEYWORDS

  • Scientific field
    XAFS, Topography, X-ray reflectivity, X-ray fluorescent analysis, X-ray imaging
  • Equipment
    25-element SSD, Lytle type detector, conversion electron yield detector, X-ray diffractometer, scintillation detector, two-dimensional detector, X-ray imaging cameras, cryostat, reactive gas equipment for in-situ measurement (shared with BL16XU), glovebox (shared with BL16XU)

SOURCE AND OPTICS

  • X-rays at sample

    Energy range 4.5 ∼ 113 keV
    Energy resolution ΔE/E ∼ 10-4
    Photon flux ∼ 1010ph/s
    Beam size ~ 0.1(H) × 0.1(V) (with mirror)
    ~ 40(H) × 2(V) (without mirror)

    Schematic View of Beamline

    Photograph of beamline BL16B2 and BL16XU

    Photograph of beamline BL16B2 and BL16XU

EXPERIMENTAL STATIONS

A large experimental table and a 6-axis X-ray diffractometer are installed in BL16B2 experimental hutch.

  • Experimental table (Fig. 1)
    • Various measurements (XAFS, topography, X-ray imaging and others) can be carried out.
    • XAFS measurements in transmission, fluorescence and conversion electron yield modes can be available.
    • 25-element SSD can be used for low concentration elements.
    • In-situ XAFS measurement under flammable and some toxic gas condition can be carried out by using reactive gas equipment.
    • X-ray imaging measurements can be carried out with using various types of detectors such as an X-ray CCD camera, a CMOS camera and a flat panel detector.
      Fig. 1 Experimental table and 25-element SSD

      Fig. 1 Experimental table and 25-element SSD

  • X-ray diffractometer (Fig. 2)
    • A 6-axis diffractometer is installed and used for X-ray diffraction, X-ray reflectivity, grazing incidence X-ray scattering and others.
    • Various types of detectors such as NaI (Tl), YAP (Ce) scintillation counter, one-dimensional detector (Mythen) and two-dimensional detector (PILATUS 100K and 300K) are available.
      Fig. 2 X-ray diffractometer

      Fig. 2 X-ray diffractometer

  • PUBLICATION SEARCH

    * Sorry, Some parts of results are displayed using Japanese characters.

    BL16B2 PUBLICATION SEARCH

    CONTACT INFORMATION


    Yoshihiro KUDO
    R&D Center, Sony Corporation
    4-14-1, Asahi-cho, Atsugi-shi, Kanagawa, 243-0014 Japan
    Phone: +81-50-3140-0424
    e-mail: Yoshihiro.Kudoatsony.com

    Website

    https://sunbeam.spring8.or.jp/

Last modified 2020-03-31 10:49
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