Molecular orientation of rubbed PI by GIXD
Inquiry number
SOL-0000000876
Beamline
BL19B2 (X-ray Diffraction and Scattering II)
Scientific keywords
| A. Sample category | organic material |
|---|---|
| B. Sample category (detail) | macromolecule, membrane |
| C. Technique | X-ray diffraction |
| D. Technique (detail) | wide angle scattering, grazing incidence X-ray diffraction/scattering |
| E. Particular condition | room temperature |
| F. Photon energy | X-ray (4-40 keV) |
| G. Target information | structure analysis |
Industrial keywords
| level 1---Application area | display |
|---|---|
| level 2---Target | LCD |
| level 3---Target (detail) | alignment film, TFT |
| level 4---Obtainable information | orientation (preferred orientation) |
| level 5---Technique | GIXD |
Classification
A80.12 semiconductor, M10.30 surface・interface diffraction
Body text
In this solution, grazing incidence X-ray diffraction was applied to a rubbed polyimide film for liquid crystal alignment in a liquid crystal display to analyze polyimide molecular orientation . In grazing incidence X-ray diffraction, incident X-rays are impinged to a sample surface with a very small angle (lower than the critical angle for total reflection) to restrict X-ray penetration depth in some teens nanometers. In this condition, sensitivity to scattered X-rays from sample surface or deposited thin film on substrate is much improved. These data reveal the fact that Main chain of the polyimide aligned in the rubbing direction.
Diffraction profiles from rubbed polyimide film in parallel and normal direction to rubbing
Source of the figure
Private communication/others
Description
自ら新たに作成した図（広沢）
Technique
Grazing incidence X-ray diffraction is performed by observing diffracted X-ray profiles caused by in-plane periodicity in thin film, surface and interface. In this solution, in-plane preferred orientation of polyimide molecules were obtained.
Source of the figure
No figure
Required time for experimental setup
1 shift(s)
Instruments
| Instrument | Purpose | Performance |
|---|---|---|
| Multi-axis diffractometer | diffraction | 4axes and 2axes |
References
| Document name |
|---|
| I. Hirosawa, Int Display Workshop (IDW)’04., 179-182 (2004). |
Related experimental techniques
GIXS, FT-IR
Questionnaire
This solution is an application of a main instrument of the beamline.
Ease of measurement
With a great skill
Ease of analysis
Middle
How many shifts were needed for taking whole data in the figure?
Two-three shifts