BL22XU HAXPES
問い合わせ番号
INS-0000001607
HAXPES
Utilizing a large probing depth of high kinetic energy photoelectrons, the surface contamination effect is drastically reduced. Especially, it is suitable for analysis of samples that have difficulty in surface cleaning. Moreover, this method is powerful to clarify the chemical states of environmental samples.
The system consists of a SCIENTA-OMICRON WE4000 large-acceptance-angle spectrometer combined with double crystal monochromator at BL22XU. Angle dependence of PES in hard x-ray region can also be performed using this system, which provides the electronic states from bulk to surface. The Combined low-energy electron / ion flood gun is installed to measure insulation. The system uses Kirkpatrick–Baez focusing mirrors to achieve a beam size of 2.3μm at the photon energy of 8keV. Through a combination of K-B mirrors and sample scanning, chemical state mapping is possible.
Fig. 1 Hard x-ray photoelectron spectroscopy system