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Pressure-induced structural change in liquid CdTe studied by in-situ high-temperature high-pressure angle-dispersive x-ray diffraction

  • Only SPring-8

Inquiry number

SOL-0000001003

Beamline

BL22XU (JAEA Actinide Science I)

Scientific keywords

A. Sample category inorganic material
B. Sample category (detail) metal, alloy, semiconductor, amorphous, glass, liquid, melt
C. Technique X-ray diffraction
D. Technique (detail) powder diffraction, wide angle scattering
E. Particular condition high pressure (press), high-T (> 500 C)
F. Photon energy X-ray (4-40 keV), X-ray (> 40 keV)
G. Target information chemical bonding, local structure

Industrial keywords

level 1---Application area Semiconductor
level 2---Target compound semiconductor
level 3---Target (detail)
level 4---Obtainable information local structure
level 5---Technique diffraction

Classification

A80.12 semiconductor, M10.20 powder diffraction

Body text

Angle-dispersive X-ray diffraction method is a powerful technique to study structural change of a matter induced at high temperatures and high pressures. Using this technique, one can measure the structures of liquids or glasses as well as those of crystalline solids. They often show significant or dramatic changes under such extreme conditions. The high-brilliance, high-energy monochromatic x-rays available on BL22XU allows collection of precise data even in a shorter time in comparison with a conventional energy-dispersive x-ray diffraction method. The figure shows pressure dependence of structure factor, S(Q), measured for liquid CdTe. These data reveal that the local structure evolves gradually from a four-fold coordinated structure to a six-fold coordinated structure as the pressure increases from 0.2 to 3.5 GPa.

Figure Pressure dependence of structure factor S(Q) for liquid CdTe

Source of the figure

Private communication/others

Description

日本原子力研究所の服部高典研究員

Technique

Source of the figure

No figure

Required time for experimental setup

48 hour(s)

Instruments

Instrument Purpose Performance
Cubic-type multi-anvil press In-situ X-ray diffraction and absorption measurements under high temperature and high pressure Temperature pressure conditions: About 12 GPa at room temperature, About 2000K at 6 GPa

References

Document name
T.Kinoshita, T.Hattori, T.Narushima and K.Tsuji, Phys.Rev.B, 72, 060102(R) (2005)

Related experimental techniques

Questionnaire

The measurement was possible only in SPring-8. Impossible or very difficult in other facilities.

Ease of measurement

With a great skill

Ease of analysis

With a great skill

How many shifts were needed for taking whole data in the figure?

Four-nine shifts

Last modified 2019-11-22 09:04