SPring-8, the large synchrotron radiation facility

Inquiry number

SOL-0000000904

Beamline

BL25SU (Soft X-ray Spectroscopy of Solid)

Scientific keywords

A. Sample category	inorganic material, research on method, instrumentation
B. Sample category (detail)	metal, alloy, semiconductor, solid-state crystal
C. Technique	X-ray diffraction, X-ray elastic scattering, photoemission, photoionization
D. Technique (detail)	photoelectron spectra, photoelectron holography
E. Particular condition	polarization (circular), 2D imaging, ultra-high vacuum, surface, interface
F. Photon energy	soft X-ray
G. Target information	local structure, structure analysis, crystal structure, phase transition

Industrial keywords

level 1---Application area	Semiconductor
level 2---Target	silicon semiconductor, compound semiconductor, catalysis
level 3---Target (detail)
level 4---Obtainable information	d-spacing (lattice parameter), interatomic distance, crystal structure, local structure, adsorption
level 5---Technique	XPS, diffraction

Classification

A30.20 surface・interface, A40.40 surface・interface chemistry, A80.12 semiconductor, A80.20 metal ・material, M10.10 single crystal diffraction, M10.30 surface・interface diffraction, M50.10 photoelectron spectroscopy

Body text

Stereoscopic microscopy of atomic arrangement is a unique technique to study the local atomic structure of surface, or impurity. Using this technique, one can measure the local atomic structure of the selected element. The long range order of the sample is not always required. In addition, the technique may have application to light element. The figure shows the stereograph of atomic arrangement of graphite single-crystal. These data reveal the fact that the stereoscopic microscopy can measure the atomic structure with high accuracy.

[ F. Matsui, H. Daimon, F. Z. Guo and T. Matsushita, Applied Physics Letters 85, 3737-3739 (2004), Fig. 2,
©2004 American Institute of Physics ]

Source of the figure

Original paper/Journal article

Journal title

Appl. Phys. Lett. 85,3737 (2004)

Figure No.

2

Technique

Stereoscopic microscopy of atomic arrangement is a unique technique to study local atomic structure.  Two photoelectron diffraction patterns excited by right and left polarized light form a stereograph of local atomic structure. The technique is applicable to crystal, adsorbates on surface, atom in interface, or impurities in crystal and provides knowledge about the local atomic structure.

Source of the figure

No figure

Required time for experimental setup

1 day(s)

Instruments

Instrument	Purpose	Performance
Two-dimensional Display-type Angle-resolved Photoelectron Analyzer (2D-PES)	Stereoscopic microscopy of Atomic arrangement	Energy range 200-1000eV, Energy reslution 0.25eV, Acceptance angle 120deg, Angular resolution 0.6deg

References

Document name
Phys. Rev. Lett. 86, 2034 (2001)

Related experimental techniques

Photoemission, Photoelectron diffraction, Photoelectron holography, Fluorescent X-ray holograply, X-ray diffraction.

Questionnaire

The measurement was possible only in SPring-8. Impossible or very difficult in other facilities.

Ease of measurement

Middle

Ease of analysis

Middle

How many shifts were needed for taking whole data in the figure?

Two-three shifts