Bulk electronic states of Ce compounds observed by resonant photoemission spectroscopy
Inquiry number
SOL-0000000944
Beamline
BL25SU (Soft X-ray Spectroscopy of Solid)
Scientific keywords
| A. Sample category | inorganic material |
|---|---|
| B. Sample category (detail) | metal, alloy, solid-state crystal, crystal |
| C. Technique | photoemission, photoionization |
| D. Technique (detail) | photoelectron spectra |
| E. Particular condition | ultra-high vacuum, low-T (~ liquid He) |
| F. Photon energy | soft X-ray |
| G. Target information | electronic state |
Industrial keywords
| level 1---Application area | industrial material |
|---|---|
| level 2---Target | |
| level 3---Target (detail) | |
| level 4---Obtainable information | electronic state |
| level 5---Technique | XPS |
Classification
M40.40 soft x-ray spectroscopy, M50.10 photoelectron spectroscopy
Body text
Resonant photoemission spectroscopy is a powerful tool to investigate electronic states of solids. Partial density of states can be extracted from valence electronic states by using the resonant condition. High energy resolution makes it possible to observe detailed electronic structures in the vicinity of the Fermi level. The figure shows the Ce 4f photoelectron spectra measured for CeRu2Si2 and CeRu2 tuning the excitation energy at the Ce 4f absorption edge. It is revealed that the spectral shapes are quite different between the samples with different Kondo temperatures.
[ A. Sekiyama, T. Iwasaki, K. Matsuda, Y. Saitoh, Y. Oniki and S. Suga, Nature 403, 396-398 (2000), Fig. 3,
©2000 Nature Publishing Group ]
Source of the figure
Original paper/Journal article
Journal title
Nature vol.403 p396(2000)
Figure No.
Fig.3
Technique
Photoemission intensity is resonantly enhanced when the excitation energy is tuned at an absorption edge of an element in a sample. 2p edges of transition metal and 3d edges of rare earth elements are typical in the energy range of BL25SU. Measurements are carried out in a UHV condition. Samples should have electric conductivity to avoid charging. Clean surfaces of the samples are obtained by cleaving or fracture in the UHV chamber.
Source of the figure
No figure
Required time for experimental setup
2 hour(s)
Instruments
| Instrument | Purpose | Performance |
|---|---|---|
| Photoemission Spectrometer (PES) | resonant photoemission spectroscopy | high resolution |
References
| Document name |
|---|
| Nature 403, 396 (2000) |
Related experimental techniques
Questionnaire
The measurement was possible only in SPring-8. Impossible or very difficult in other facilities.
This solution is an application of a main instrument of the beamline.
Similar experiments account for more than 30% of the beamline's subject.
Ease of measurement
Middle
Ease of analysis
Middle
How many shifts were needed for taking whole data in the figure?
Four-nine shifts

