SPring-8, the large synchrotron radiation facility

Inquiry number

SOL-0000000975

Beamline

BL29XU (RIKEN Coherent X-ray Optics)

Scientific keywords

A. Sample category	inorganic material, organic material, biology, medicine
B. Sample category (detail)	metal, alloy, semiconductor, insulator, ceramics, organism, cell, biological material
C. Technique	fluorescent X-rays
D. Technique (detail)	trace-element
E. Particular condition	microbeam (1-10 µm), microbeam (sub-µm), 2D imaging
F. Photon energy	X-ray (4-40 keV)
G. Target information	structure analysis, function and structure

Industrial keywords

level 1---Application area	environment, Pharmaceuticals
level 2---Target	drug design, Environmental material
level 3---Target (detail)	organism
level 4---Obtainable information	element distribution
level 5---Technique	imaging

Classification

A80.20 metal ・material, A80.30 inorganic material, A80.32 organic material, A80.50 Pharmaceuticals, A80.90 others

Body text

Scanning x-ray fluorescence microscopy is an efficient technique to study element distribution. Element mapping with a spatial resolution of tens of nm can be performed with a Kirkpatrick-Baez type x-ray focusing system composed of ultra-precise x-ray total reflection mirrors.
The following figure shows the element maps of CDDP-sensitive and -resistant cancer cells. A 15 keV x-ray beam was focused to a spot size of 1.5 m (H) 0.75 m (W) on the sample. These data helped to propose a novel cancer treatment.

Fig. Element maps of cancer cells by scanning x-ray fluorescence microscopy

[ M. Shimura, A. Saito, S. Matsuyama, T. Sakuma, Y. Terui, K. Ueno, H. Yumoto, K. Yamamura, H. Mimura, Y. Sano, M. Yabashi, K. Tamasaku, K. Nishio, Y. Nishino, K. Endo, K. Hatake, Y. Mori and Y. Ishizuka, Cancer Research 65, 4998-5002 (2005), Fig. 1,
©2005 American Society of Cancer Research ]

Source of the figure

Original paper/Journal article

Journal title

M. Shimura, A. Saito, S. Matsuyama, T. Sakuma, Y. Terui, K. Ueno, H. Yumoto, K. Yamauchi, K. Yamamura, H. Mimura, Y. Sano, M. Yabashi, K. Tamasaku, K. Nishio, Y. Nishino, K. Endo, K. Hatake, Y. Mori, Y. Ishizaka, and T. Ishikawa, Cancer Res. 65, 4998-5002 (2005)

Figure No.

１

Technique

Two-dimensional focusing of an x-ray beam is performed using two focusing mirrors in the Kirkpatrick-Baez configuration. Fluorescent X-ray spectroscopy is performed using a silicon drift detector.

Source of the figure

No figure

Required time for experimental setup

hour(s)

Instruments

Instrument	Purpose	Performance
Kirkpatrick-Baez type x-ray focusing system
silicon drift detector

References

Document name
M. Shimura, A. Saito, S. Matsuyama, T. Sakuma, Y. Terui, K. Ueno, H. Yumoto, K. Yamauchi, K. Yamamura, H. Mimura, Y. Sano, M. Yabashi, K. Tamasaku, K. Nishio, Y. Nishino, K. Endo, K. Hatake, Y. Mori, Y. Ishizaka, and T. Ishikawa,　Cancer Res. 65, 4998-5002 (2005)

Related experimental techniques

Questionnaire

With user's own instruments.

Ease of measurement

With a great skill

Ease of analysis

With a great skill

How many shifts were needed for taking whole data in the figure?

Four-nine shifts