Photon interference x-ray absorption fine structure
Inquiry number
SOL-0000001054
Beamline
BL29XU (RIKEN Coherent X-ray Optics)
Scientific keywords
| A. Sample category | inorganic material |
|---|---|
| B. Sample category (detail) | metal, alloy, semiconductor, insulator, ceramics |
| C. Technique | absorption and its secondary process |
| D. Technique (detail) | XAFS |
| E. Particular condition | |
| F. Photon energy | X-ray (4-40 keV) |
| G. Target information | local structure |
Industrial keywords
| level 1---Application area | others |
|---|---|
| level 2---Target | |
| level 3---Target (detail) | |
| level 4---Obtainable information | interatomic distance, local structure |
| level 5---Technique | XAFS |
Classification
A80.12 semiconductor, A80.20 metal ・material, A80.30 inorganic material, A80.32 organic material, M40.10 XAFS
Body text
Photon interference x-ray absorption fine structure (XAFS) occurs in x-ray absorption spectra due to the interference of incident x-rays. In difference to conventional XAFS, it exists over a wide energy range across absorption edges. It provides information of local structure, such as interatomic distances and coordination numbers.
The following figures show XAFS of platinum far above and below the L absorption edge.
Fig. XAFS of platinum far above the L absorption edge.
Fig. XAFS of platinum below the L absorption edge.
[ Y. Nishino, T. Ishikawa, M. Suzuki, N. Kawamura, P. Kappen, P. Korecki, N. Haack and G. Materlik, Physical Review B 66, 113103 (2002), Fig. 1, 2,
©2002 American Physical Society ]
Source of the figure
Original paper/Journal article
Journal title
Y. Nishino, T. Ishikawa, M. Suzuki, N. Kawamura, P. Kappen, P. Korecki, N. Haack, and G. Materlik, Phys. Rev. B 66, 113103 (2002)
Figure No.
1,2
Technique
X-ray absorption coefficients are measured in the transmission scheme.
Source of the figure
No figure
Required time for experimental setup
1 hour(s)
Instruments
References
| Document name |
|---|
| Y. Nishino, T. Ishikawa, M. Suzuki, N. Kawamura, P. Kappen, P. Korecki, N. Haack, and G. Materlik, Phys. Rev. B 66, 113103 (2002) |
Related experimental techniques
Questionnaire
With user's own instruments.
Ease of measurement
Middle
Ease of analysis
With a great skill
How many shifts were needed for taking whole data in the figure?
Four-nine shifts