原子分解能Ｘ線ホログラフィー
Inquiry number
SOL-0000001542
Beamline
BL29XU (RIKEN Coherent X-ray Optics)
Scientific keywords
| A. Sample category | inorganic material |
|---|---|
| B. Sample category (detail) | metal, alloy, semiconductor, insulator, ceramics, crystal |
| C. Technique | absorption and its secondary process, fluorescent X-rays |
| D. Technique (detail) | fluorescent X-ray holography |
| E. Particular condition | 3D imaging (cf. CT), X-ray microscopy |
| F. Photon energy | X-ray (4-40 keV) |
| G. Target information | structure analysis |
Industrial keywords
| level 1---Application area | others |
|---|---|
| level 2---Target | |
| level 3---Target (detail) | |
| level 4---Obtainable information | |
| level 5---Technique | imaging |
Classification
A80.12 semiconductor, A80.20 metal ・material, A80.30 inorganic material, A80.32 organic material
Body text
原子分解能Ｘ線ホログラフィーは三次元原子構造を可視化できるユニークな手法です。この手法を用いることで、特定の元素近傍の局所構造を測定することができます。
図に示すのは、ZnSe試料のホログラムと三次元再生像です。
図 ZnSeのホログラム
図 ZnSeの三次元再生像
[ Y. Nishino, T. Ishikawa, K. Hayashi, Y. Takahashi and E. Matsubara, Physical Review B 66, 092105 (2002), Fig. 3, 4,
©2002 American Physical Society ]
Source of the figure
Original paper/Journal article
Journal title
Y. Nishino, T. Ishikawa, K. Hayashi, Y. Takahashi, and E. Matsubara, Phys. Rev. B 66, 092105 (2002)
Figure No.
3,4
Technique
内部検出器原子分解能Ｘ線ホログラフィーでは様々な入射角での蛍光Ｘ線強度を測定します。蛍光Ｘ線分光はアナライザ結晶またはエネルギー分散Ｘ線検出器を用いて行います。
図 原子分解能Ｘ線ホログラフィー装置の概略図
[ Y. Nishino, T. Ishikawa, K. Hayashi, Y. Takahashi and E. Matsubara, Physical Review B 66, 092105 (2002), Fig. 2,
©2002 American Physical Society ]
Source of the figure
Original paper/Journal article
Journal title
Y. Nishino, T. Ishikawa, K. Hayashi, Y. Takahashi, and E. Matsubara, Phys. Rev. B 66, 092105 (2002)
Figure No.
2
Required time for experimental setup
12 hour(s)
Instruments
References
| Document name |
|---|
| Y. Nishino, T. Ishikawa, K. Hayashi, Y. Takahashi, and E. Matsubara, Phys. Rev. B 66, 092105 (2002) |
Related experimental techniques
Questionnaire
With user's own instruments.
Ease of measurement
With a great skill
Ease of analysis
With a great skill
How many shifts were needed for taking whole data in the figure?
More than ten shifts