Element-specific magnetometry in Gd/Fe multilayers
Inquiry number
SOL-0000000866
Beamline
BL39XU (X-ray Absorption and Emission Spectroscopy)
Scientific keywords
| A. Sample category | inorganic material |
|---|---|
| B. Sample category (detail) | magnetic material |
| C. Technique | absorption and its secondary process |
| D. Technique (detail) | MCD, LD |
| E. Particular condition | polarization (circular), magnetic field (< 2 T), room temperature |
| F. Photon energy | X-ray (4-40 keV) |
| G. Target information | spin/magnetism |
Industrial keywords
| level 1---Application area | storage device |
|---|---|
| level 2---Target | HD,MO |
| level 3---Target (detail) | magnetic layer, magnetic head, spin valve |
| level 4---Obtainable information | magnetic moment, magnetic anisotropy, interface magnetic structure |
| level 5---Technique | XMCD |
Classification
A80.14 magnetic materials, M40.30 XMCD
Body text
Element-specific magnetometry is a unique technique to study magnetism of a particular element in the sample. Using this technique, one can measure magnetization of the specific layers of layered magnetic films containing different magnetic elements. Magnetization of buried layers is probed with a same sensitivity as for the surface layer, using high-energy X-rays of a penetration depth as large as a few microns.
The figure shows the element-specific magnetization curves of Gd and Fe of a [Gd(2 nm)/Fe(2 nm)]50 multilayer. These data indicate that the magnetic moments of Gd and Fe layers couple antiferromagnetically, and the shape of the hysteresis loops and the coercive force values are quite different from the magnetization of entire sample.
Fig. Element-specific magnetization curves in a [Gd(2 nm)/Fe(2 nm)]50 multilayer.
[ A. Koizumi, M. Takagaki, M. Suzuki, N. Kawamura and N. Sakai, Physical Review B 61, R14909-R14912 (2000), Fig. 2,
©2000 American Physical Society ]
Source of the figure
Original paper/Journal article
Journal title
A. Koizumi, M. Takagaki, et al, Phys. Rev. B 61, R14909 (2000).
Figure No.
Fig. 2
Technique
An element-specific magnetization curve is measured by monitoring the difference in X-ray absorption of the sample between for right- and left-circularly polarized X-rays, as a function of the external magnetic field. In this solution, X-ray energy was tuned to the characteristic absorption edges of Gd (7245 eV) and Fe (7111 eV) to obtain the magnetization curves for these elements.
Fig. Principle of element-specific magnetization measurement.
Source of the figure
Private communication/others
Description
鈴木基寛が作成
Required time for experimental setup
5 hour(s)
Instruments
| Instrument | Purpose | Performance |
|---|---|---|
| Electromagnet and closed-cycle helium refrigerator | element-specific magnetometry measurements | magnetic field ±2 T, sample temerature 20-300 K |
| 10 T superconducting magnet | XMCD spectroscopy and element-specific magnetometry measurements under high magnetic field | magnetic field ±10 T, sample temerature 1.7-300 K |
| Helicity-modulation XMCD | detection of XMCD signals with high accuracy and high sensitivity | XMCD signals less than 0.1% are detectable |
References
| Document name |
|---|
| A. Koizumi, M. Takagaki, M. Suzuki, N. Kawamura, and N. Sakai, Phys. Rev. B 61, R14909 (2000). |
| M. Takagaki, A. Koizumi, N. Kawamura, M. Suzuki, and N. Sakai, J. Phys. Soc. Jpn. 72, 245 (2003). |
Related experimental techniques
VSM magnetometry, SQUID magnetometry, torque magnetometry, magnetic Kerr measurement, X-ray magnetic diffraction, X-ray magnetic reflection, XMCD
Questionnaire
The measurement was possible only in SPring-8. Impossible or very difficult in other facilities.
This solution is an application of a main instrument of the beamline.
Similar experiments account for more than 30% of the beamline's subject.
Ease of measurement
Easy
Ease of analysis
Middle
How many shifts were needed for taking whole data in the figure?
Less than one shift



