Emittance measurement
Inquiry number
SOL-0000001100
Beamline
BL47XU (Micro-CT)
Scientific keywords
| A. Sample category | research on method, instrumentation |
|---|---|
| B. Sample category (detail) | |
| C. Technique | X-ray diffraction |
| D. Technique (detail) | reflection, refraction |
| E. Particular condition | 2D imaging |
| F. Photon energy | X-ray (4-40 keV) |
| G. Target information |
Industrial keywords
| level 1---Application area | |
|---|---|
| level 2---Target | |
| level 3---Target (detail) | |
| level 4---Obtainable information | |
| level 5---Technique |
Classification
Body text
We presented a method of using crystal optics to measure the emittance of the X-ray source. Two perfect crystals set in (++) configuration work as a high-resolution collimator. The phase-space diagram (i.e. beam cross-section and angular distribution) could be determined without any assumptions on the light source. The measurement was done with the hard X-rays of 18.5 keV and 55 keV from an undulator beamline, BL 47XU, of SPring-8. The figures show the experimental setup. The horizontal emittance of the X-ray beam was estimated to be about 7.6 nmrad, close to the designed electron beam emittance of the storage ring (7 nmrad). The upper limit for the vertical emittance of the electron beam, 0.14 nmrad, was obtained. The instrumental functions, such as the scattering by filters and windows along the beamline and the slight bent of the crystal planes of the monochromator are included in these measured results.
[ Y. Kohmura, Y. Suzuki, M. Awaji, T. Tanaka, T. Hara, S. Goto and T. Ishikawa, Nuclear Instruments and Methods in Physics Research A 452, 343-350 (2000), Fig. 2, 6, 9,
©2000 Elsevier Science Publisher ]
Source of the figure
Original paper/Journal article
Journal title
Nuclear Instruments and Methods in Physics Research A 452, 343-350 (2000)
Figure No.
2,6,9
Technique
Source of the figure
No figure
Required time for experimental setup
7 day(s)
Instruments
| Instrument | Purpose | Performance |
|---|---|---|
| Kouzu Diffractometer | Aligning crystals | |
| Hitachi Denshi X-ray camera | high resolution detector |
References
| Document name |
|---|
| Y.Kohmura et al., Nuclear Instruments and Methods in Physics Research A 452, 343-350 (2000) |
Related experimental techniques
Questionnaire
The measurement was possible only in SPring-8. Impossible or very difficult in other facilities.
This solution is an application of a main instrument of the beamline.
Ease of measurement
With a great skill
Ease of analysis
Middle
How many shifts were needed for taking whole data in the figure?
More than ten shifts