Grain boundary characterization utilizing high-resolution X-ray CT and SEM/EBSP orientation analysis
Inquiry number
SOL-0000004508
Beamline
BL47XU (Micro-CT)
Scientific keywords
| A. Sample category | inorganic material |
|---|---|
| B. Sample category (detail) | metal, alloy, solid-state crystal |
| C. Technique | absorption and its secondary process |
| D. Technique (detail) | |
| E. Particular condition | 3D imaging (cf. CT), interface, room temperature, time-resolved (slow) |
| F. Photon energy | X-ray (4-40 keV) |
| G. Target information | local structure, dislocation, strain, structural change, morphology |
Industrial keywords
| level 1---Application area | mechanics, industrial material |
|---|---|
| level 2---Target | Steel |
| level 3---Target (detail) | |
| level 4---Obtainable information | crack, crevice, structure, molphology |
| level 5---Technique | imaging |
Classification
A80.20 metal ・material, A80.30 inorganic material, M60.20 X-ray CT
Body text
High-resolution X-ray computer tomography is a non-destructive inspection to study micro-defects of inside materials three dimensionally. An elemental mass ratio, i.e. concentration is investigated by the use of a linear absorption coefficient value, which is different from elementals in the X-ray CT. Figures show (a) distribution of gallium concentration obtained by X-ray CT and (b) grain orientation mapping investigated by SEM/EBSP analysis in the same region of a sample surface. High concentrations have been observed on grain boundary with a high misorientation angle that is considered having high energy. Dependence of the concentration on grain boundary character is revealed.
Source of the figure
Original paper/Journal article
Journal title
小林正和，戸田裕之，他：軽金属学会第108回春期大会講演概要(2005)，p.215-216.
Figure No.
Technique
Source of the figure
No figure
Required time for experimental setup
1 shift(s)
Instruments
| Instrument | Purpose | Performance |
|---|---|---|
| X-ray CT system | obtain 3D internal structures of materials | spatial resolution of about 1um |
References
| Document name |
|---|
| 小林正和，戸田裕之，他：軽金属学会第108回春期大会講演概要(2005)，p.215-216. |
| M. Kobayashi, H. Toda, Scripta Mater., to be submitted. |
Related experimental techniques
Questionnaire
The measurement was possible only in SPring-8. Impossible or very difficult in other facilities.
This solution is an application of a main instrument of the beamline.
Ease of measurement
Middle
Ease of analysis
Middle
How many shifts were needed for taking whole data in the figure?
Two-three shifts