高分解能X線CTとSEM/EBSP結晶方位解析の援用による粒界性格の解明
Inquiry number
SOL-0000001699
Beamline
BL47XU (Micro-CT)
Scientific keywords
| A. Sample category | inorganic material |
|---|---|
| B. Sample category (detail) | metal, alloy, solid-state crystal |
| C. Technique | absorption and its secondary process |
| D. Technique (detail) | |
| E. Particular condition | 3D imaging (cf. CT), interface, room temperature, time-resolved (slow) |
| F. Photon energy | X-ray (4-40 keV) |
| G. Target information | local structure, dislocation, strain, structural change, morphology |
Industrial keywords
| level 1---Application area | mechanics, industrial material |
|---|---|
| level 2---Target | Steel |
| level 3---Target (detail) | |
| level 4---Obtainable information | crack, crevice, structure, molphology |
| level 5---Technique | imaging |
Classification
A80.20 metal ・material, A80.30 inorganic material, M60.20 X-ray CT
Body text
高分解能X線コンピュータ・トモグラフィー法は材料内部を非破壊で三次元的に見ることのできる方法です。X線CT結果に対して，元素によって異なるX線の質量吸収係数を利用することで，それらの質量比，すなわち，濃度を測定することができます。図に示すのは，粒界にGaを含浸させた6061アルミニウム合金の表面におけるX線CT観察のGa濃度分布(図(a))とSEM/EBSP結晶方位マッピング(図(b))との対応です。Ga濃度は高い粒界エネルギーを持つ方位差の大きな粒界部分でのみ高く，その粒界性格依存性が分かりました。
Source of the figure
Original paper/Journal article
Journal title
小林正和，戸田裕之，他：軽金属学会第108回春期大会講演概要(2005)，p.215-216.
Figure No.
Technique
Source of the figure
No figure
Required time for experimental setup
1 shift(s)
Instruments
| Instrument | Purpose | Performance |
|---|---|---|
| X線CT装置 | 物体の内部構造を測定する | 空間分解能で約1ミクロン程度 |
References
| Document name |
|---|
| 小林正和，戸田裕之，他：軽金属学会第108回春期大会講演概要(2005)，p.215-216. |
| M. Kobayashi, H. Toda, Scripta Mater., to be submitted. |
Related experimental techniques
Questionnaire
The measurement was possible only in SPring-8. Impossible or very difficult in other facilities.
This solution is an application of a main instrument of the beamline.
Ease of measurement
Middle
Ease of analysis
Middle
How many shifts were needed for taking whole data in the figure?
Two-three shifts