SPring-8, the large synchrotron radiation facility

Inquiry number

SOL-0000001139

Beamline

BL04B2 (High Energy X-ray Diffraction)

Scientific keywords

A. Sample category	inorganic material
B. Sample category (detail)	liquid, melt
C. Technique	X-ray diffraction
D. Technique (detail)	wide angle scattering
E. Particular condition	high-T (> 500 C)
F. Photon energy	X-ray (> 40 keV)
G. Target information	structure analysis

Industrial keywords

level 1---Application area	mechanics, industrial material, others
level 2---Target	Steel
level 3---Target (detail)
level 4---Obtainable information	structure of non-crystalline material
level 5---Technique	diffraction

Classification

M20.20 middle angle scattering

Body text

High-energy x-ray diffraction is a powerful technique to study the structure of leviated liquids. Using this technique, one can obtain interatomic correlations of disordered structure in liquids. The high-flux high-energy x-rays allow us to measure reliable diffraction pattern of small size of leviated liquids.
Figure 1 (a) shows a conical nozzle leivation equipment integrated with the two-axis diffractometer for disordered materials in BL04B2 beamline. The leviated specimen is shown in Fig. 1(b).
Figure 2 shows structure factor of Zr₇₀Cu₃₀ liquid obtained at 1453 K. As can be seen from Fig. 1(b), we have succeeded in obtaining the high-quality data of levitated liquid. A combination of the use of high-energy x-rays and a conical nozzle leviation will allow us to study the structure of deeply undercooled liquids.

Fig. 1 Photograph of a conical nozzle leviation equipment (a) and a levitated specimen (Zr₇₀Cu₃₀, 1453 K) (b), and the structure factor S(Q).

[ S. Nakano, S. Yamaura, A. Kitano, M. Sato, N. Umesaki, S. Uchinashi, H. Kimura and A. Inoue, Materials Transactions 46, 379-381 (2005), Fig. 3,
©2005 The Japan Institute of Metals ]

Source of the figure

Original paper/Journal article

Journal title

Mater. Trans. 46 (2005)

Figure No.

3

Technique

High-energy x-ray diffraction is a powerful tool to study the structure of disordered materials. The analysis of the diffraction pattern makes it possible to derive inter-atomic distance, coordination number and so on. One of the advantage of the diffraction in comparison with EXAFS is that intermediate-range order, which can be analyzed by computer simulation based on diffraction data. A combination of high-energy x-ray diffraction, neutron diffraction, and computer simulation is an essential tool to study the structure of disordered materials.

[ S. Kohara, Y. Ohishi, M. Takata, Y. Yoneda and K. Suzuya, Journal of the Crystallographic Society of Japan 47, 123-129 (2005), Fig. 1,
©2005 The Crystallographic Society of Japan ]

Source of the figure

Original paper/Journal article

Journal title

日本結晶学会誌,47,123-129(2005)

Figure No.

Required time for experimental setup

24 hour(s)

Instruments

Instrument	Purpose	Performance
Two-axis diffractometer	to get diffraction pattern	113.4 keV

References

Document name
X線構造解析—原子の配列を決める 材料学シリーズ　早稲田 嘉夫, 松原 英一郎

Related experimental techniques

Questionnaire

The measurement was possible only in SPring-8. Impossible or very difficult in other facilities.
This solution is an application of a main instrument of the beamline.
This solution is application of a new instrument installed in the past two years.
With user's own instruments.

Ease of measurement

With a great skill

Ease of analysis

Middle

How many shifts were needed for taking whole data in the figure?

Two-three shifts