General/Budding Research Suport/Time-Designated /SP8 Measurement Service Proposals 2007B (4/11)
| S/N | #1～50 | #51～100 | #101～150 | #151～200 | #201～250 | #251～300 | #301～350 | #351～400 | #401～450 | #451～500 | #501～553 |
CONTACT: SPring-8 Users Office; E-mail: sp8jasri@spring8.or.jp
| S/N | Proposal No. | Title of Experiment | Project Leader | Affiliation | Country | Beamline | Shifts | Type* |
| 151 | 2007B1547 | Variations of structure and physical property induced by the high-low spin transition of ferric iron in Mg-perovskite | Kiyoshi Fujino | Hokkaido University | Japan | BL10XU | 9 | np |
| 152 | 2007B1549 | X-ray diffraction under high pressure in UIr | Tatsuo C. Kobayashi | Okayama University | Japan | BL10XU | 6 | np |
| 153 | 2007B1562 | Phase transition of iron-silicon alloy at megabar pressure and high temperature | Eiji Ohtani | Tohoku University | Japan | BL10XU | 9 | np |
| 154 | 2007B1633 | Pressure induced phase transition of semiconductor clathrate compounds | Tetsuji Kume | Gifu University | Japan | BL10XU | 6 | np |
| 155 | 2007B1639 | Generation of very high pressure using high-purity nano-polycrystalline diamonds | Yuki Nakamoto | Osaka University | Japan | BL10XU | 12 | np |
| 156 | 2007B1647 | Structral change of cluster of alpha-Boron under pressure | Yoshihisa Mori | Okayama University of Science | Japan | BL10XU | 12 | np |
| 157 | 2007B1649 | Structural study of superconducting elements under very high pressure | Katsuya Shimizu | Osaka University | Japan | BL10XU | 18 | np |
| 158 | 2007B1059 | Measurement of internal stress in each layers for nano-thickness multi-layered copper and aluminum nitride films | Takao Hanabusa | The University of Tokushima | Japan | BL13XU | 12 | np |
| 159 | 2007B1071 | X-ray structure of an copper rubeanate ultra-thin film on an ultra-smooth surface of a sapphire (0001) substrate | Rie Haruki | Japan Synchrotron Radiation Research Institute | Japan | BL13XU | 6 | np |
| 160 | 2007B1079 | Diffraction mapping of complex refractive index in nano-structures using the phase-retrieval x-ray diffractometry method | Andrei Nikulin | Monash University | Australia | BL13XU | 15 | np |
| 161 | 2007B1112 | Critical behavior of Peierls transition on the In/Si(111) surface | Shin-ichiro Hatta | Kyoto University | Japan | BL13XU | 12 | np |
| 162 | 2007B1227 | In-situ surface X-ray diffraction of stepped surface of Pt with high activity for fuel cell reactions: Pt(911)=5(100)-(111) | Nagahiro Hoshi | Chiba University | Japan | BL13XU | 12 | np |
| 163 | 2007B1326 | Detailed X-ray structure analysis ofinterface between heteroepitaxial Sr and Si substrates - Determination of interfacial structure by X-ray CTR scattering - | Hidehito Asaoka | Japan Atomic Energy Agency | Japan | BL13XU | 6 | np |
| 164 | 2007B1342 | Network structure of water adsorbed on Ni(110) | Masashi Nakamura | Chiba University | Japan | BL13XU | 12 | np |
| 165 | 2007B1362 | CTR surface structure analysis on a platinum-alloy single crystal in an aqueous media | Hideto Imai | NEC Corporation | Japan | BL13XU | 9 | np |
| 166 | 2007B1478 | An in situ observation on variation of surface morphology of Quartz triggered by formation of Dauphine twins | Isao Takahashi | Kwansei Gakuin University | Japan | BL13XU | 9 | np |
| 167 | 2007B1530 | GIXD Study on Surface Molecular Aggregation States of Crystalline-Amorphous Diblock Polymer Brush Thin Films | Atsushi Takahara | Kyushu University | Japan | BL13XU | 9 | np |
| 168 | 2007B1532 | Precise determination of crystal orientation in surface X-ray diffraction using pseudo-Kossel line | Hiroo Tajiri | Japan Synchrotron Radiation Research Institute | Japan | BL13XU | 6 | np |
| 169 | 2007B1596 | Diffraction measurement system for in-situ structure analysis of functional thin films under an electric field | Osami Sakata | Japan Synchrotron Radiation Research Institute | Japan | BL13XU | 9 | np |
| 170 | 2007B1677 | In-situ X-ray diffraction study of crystal structure of multiferroic BiFeO3 thin films with applying electric field | Seiji Nakashima | Osaka University | Japan | BL13XU | 9 | BRS |
| 171 | 2007B1681 | Three dimensional nanowire synthesis of metallic silicon | Masashi Tsujino | Osaka University | Japan | BL13XU | 12 | BRS |
| 172 | 2007B1015 | Structual analysis of small amount of additives on Metal Oxide Files by X-ray absorption pectroscopy | Tadao Shibuya | Idemitsu Kosan Co.,Ltd. | Japan | BL14B2 | 6 | p |
| 173 | 2007B1017 | Chemical structure analysis for added elements in catalysts using XAFS-method | Tsutomu Fujita | Mitsubishi Rayon Co.,Ltd. | Japan | BL14B2 | 1 | p |
| 174 | 2007B1018 | XAFS study on local structures of inorganic materials. | Yuuichi Okamoto | FUJIFILM Corporation | Japan | BL14B2 | 12 | p |
| 175 | 2007B1022 | Phase Change Memory Alloy XAFS Investigtions | Paul Fons | National Institute of Advanced Industrial Science and Technology | Japan | BL14B2 | 3 | p |
| 176 | 2007B1026 | local structure analysis of catalysts for fuel cell by XAFS | Taihei Mukaide | Canon Inc. | Japan | BL14B2 | 3 | p |
| 177 | 2007B1039 | Analysis of Fine Structures on Nano-Sized Catalysts by Means of XAFS | Hideo Daimon | Hitachi Maxell, Ltd. | Japan | BL14B2 | 3 | p |
| 178 | 2007B1881 | Education and Training for Graduate School Student with Synchrotron Radiation | Isao Harada | Okayama University | Japan | BL14B2 | 2 | Up |
| 179 | 2007B1904 | Characterization of materials for PEFCs by X-ray absorption fine structure spectroscopy (5) | Hiroyuki Kageyama | National Institute of Advanced Industrial Science and Technology | Japan | BL14B2 | 6 | p |
| 180 | 2007B1905 | Investigation of PtRu particle structure on carbon black with XAFS Method | Joji Kuniya | Shin-Etsu Chemical Co., Ltd. | Japan | BL14B2 | 2 | p |
| 181 | 2007B1906 | XAFS study on local structures of inorganic materials. | Yuuichi Okamoto | FUJIFILM Corporation | Japan | BL14B2 | 6 | p |
| 182 | 2007B1907 | Education and Training for Graduate School Student with Synchrotron Radiation | Isao Harada | Okayama University | Japan | BL14B2 | 6 | p |
| 183 | 2007B1909 | Structure analysis of the interface between RuO2 and glass on the composite material consisting of ruthenium oxide particles and glass matrix. | Masashi Totokawa | Denso Corporation | Japan | BL14B2 | 1 | p |
| 184 | 2007B1910 | XAFS mesurement of oxide thin film | Hirokazu Kimiya | Matsushita Electric Industrial Co., Ltd. | Japan | BL14B2 | 2 | p |
| 185 | 2007B1913 | XAFS analysis of dielectric material | Yukihiro Hayase | Murata Manufacturing Co., Ltd. | Japan | BL14B2 | 2 | p |
| 186 | 2007B1950 | Study of gas supply and exhaust system for in-situ XAFS measurement | Sayaka Hirayama | Japan Synchrotron Radiation Research Institute | Japan | BL14B2 | 6 | np |
| 187 | 2007B1974 | Conformation analysis of Pd/C | Ryosuke Kunitani | Shionogi & Co., Ltd. | Japan | BL14B2 | 2 | Up |
| 188 | 2007B1985 | Charactarization of surface structure for metal materials by XAFS (2) | Shigeo Sato | NISSAN ARC, LTD. | Japan | BL14B2 | 2 | Up |
| 189 | 2007B1989 | [Analysis request] Analysis of Titanium Fine Particles using XAFS | Noriko Yamazaki | Mitsubishi Heavy Industries, Ltd. | Japan | BL14B2 | 0.75 | Up |
| 190 | 2007B1990 | [Analysis request] | Syuji Matsumoto | Asahi Glass Company | Japan | BL14B2 | 0.75 | Up |
| 191 | 2007B1991 | [Analysis request] XAFS measurement of antimony compounds | Kazunari Shiozawa | Mitsui Chemical Analysis & Consulting Service Inc. | Japan | BL14B2 | 1.25 | Up |
| 192 | 2007B2014 | Charactarization of surface structure for the metal materials by XAFS (3) | Shigeo Sato | NISSAN ARC, LTD. | Japan | BL14B2 | 3 | Up |
| 193 | 2007B2016 | [Analysis request] Study on thermal stability of positive electrode materials for Li secondary battery | Masahiro Shikano | National Institute of Advanced Industrial Science and Technology | Japan | BL14B2 | 0.5 | Up |
| 194 | 2007B2017 | [Analysis request] XAFS analysis of oxide materials | Tsukasa Nakai | Toshiba Corporation | Japan | BL14B2 | 2 | Up |
| 195 | 2007B2019 | Local structural analysis of nanodaimonds implanted of paramagnetic ions | Morita Masahito | Shiga University of Medical Science | Japan | BL14B2 | 1 | Up |
| 196 | 2007B2029 | [Analysis request] Study on thermal stability of positive electrode materials for Li secondary battery | Masahiro Shikano | National Institute of Advanced Industrial Science and Technology | Japan | BL14B2 | 1.5 | Up |
| 197 | 2007B2030 | [Analysis request] XAFS analysis of oxide materials (2) | Tsukasa Nakai | Toshiba Corporation | Japan | BL14B2 | 0.75 | Up |
| 198 | 2007B2031 | [Analysis request] XAFS measurement | Junji Iihara | Sumitomo Electric Industories, Ltd. | Japan | BL14B2 | 0.5 | Up |
| 199 | 2007B1136 | Photoelectron emission microscopic study on electric-field-induced switching of resistance random access memory | Masaharu Oshima | The University of Tokyo | Japan | BL17SU | 12 | np |
| 200 | 2007B1261 | Artificial creation of meteoritic L10-FeNi and its evaluation using photolectron emission microscope (SPELEEM) | Masato Kotsugi | Japan Synchrotron Radiation Research Institute | Japan | BL17SU | 9 | np |
*Type p:proprietary, np: non-proprietary. Up:Time-Designated (Urgent proprietary), BRS: Budding Researchers Support