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Particle size distribution analysis for nano-SiO2 powder by ultra-small angle X-ray scattering
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Crystal structure of alpha-MnO2 analyzed by Rietveld refinements and MEM-based pattern fitting
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Synchrotron X-ray and TOF neutron powder diffraction study of Co3.6Fe3.6(VO4)6
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High-resolution and high-intensity powder diffractometer at BL15XU
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XANES measurement with SR monochromatized by YB66 crystal
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Various measurement with the PFY-XAFS(Partial Fluorescence Yield XAFS)
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DVD XANES analysis by XPEEM with high energy X-ray
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High energy XPS analysis on chemical reaction of catalytic Fe on Si : catalysis of carbon nanotube
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High energy XPS interface analysis of magnetic tunnel junction device