• XAFS in wide energy region (3.8 to 113 keV)
• XAFS of dilute systems and thin films
• Time resolved XAFS by quick scan

• Charge density study by single crystal X-ray diffraction
• Crystal structure analysis of micro single crystal
• Investigation of phase transition under external field

• Charge density studies closely related to properties of functional materials
• Structural aspects of phase transition
• Ab initio structure determination using powder diffraction data
• Structural refinements by Rietveld method
• Thin-film diffraction
• In-situ difftaction experimnent under gas adsorption and/or photo irradiation

• Research development of organic or polymer materials as thin files, fiber, bulk, film, and solution.
• Structural analysis of materials using X-ray scattering measurements.
• X-ray measurement for polymer thin film or organic thin film
• Innovations in the manufacturing process for soft and polymer materials.
• Observation on a structure changing under a controlled environment by real-time X-ray measurement with a large processing apparatus
• Observation of a change in the hierarchal structure at Å~µm scale by simultaneous measurement

• X-ray diffraction measurements and radiography under extreme
• Conditions using large-volume press up to 100 GPa/3000 K
• Energy dispersive X-ray diffraction measurements (2θ = 3-20°/ 20-150 keV)
• Angle dispersive X-ray diffraction measurements (30-60 keV/ 2θ = <10°)

• Structure analysis of glass, liquid, and amorphous materials
• X-ray diffraction under high pressure
• Small angle scattering measurements of supercritical fluids

• Accelerator science
• Accelerator beam diagnostics
• R&D of accelerator components
• Development of photon sources
• Automated X-ray Fluorescence Analysis
• X-ray microspectroscopy

• Solid State Physics
• Physical Chemistry
• Applied Chemistry
• Applied Physics

• Magnetic Compton scattering
• High-resolution Compton scattering
• High-energy Bragg scattering
• High-energy fluorescent X-ray analysis

• XAFS in a wide energy region
• Small angle X-ray scattering for structural analyses of polymer and nano-composite materials
• X-ray topography
• Imaging
• Powder diffraction with a high angular resolution

• Materials science using nuclear resonant scattering
  Electronic property studied by Mössbauer spectroscopy using synchrotron radiation
  Lattice dynamics studied by using nuclear inelastic scattering
• Nuclear physics and X-ray optics using nuclear resonant scattering
  Nuclear excitation by electron transition (NEET)
  Coherent X-ray optics using nuclear resonant scattering
• Materials science using hard x-ray photoemission spectroscopy
  Variable depth analysis of electronic properties with high energy resolution
  X-ray polarization tunability with phase retarder and analysis for observing magnetic effects
  Various applications both in basic and applied research fields under low temperature of 8K

• Structure analysis and phase transitions under ultra high pressure (DAC experiment)
• Earth and planetary science

• Nuclear Resonant Scattering
• Surface and interface structure with MBE
• Inelastic scattering
• XAFS

• Elementary electronic excitations, quasiparticle behaviors, and electron-correlation effects in correlated electron systems investigated usinghigh resolution non-resonantorresonant inelastic X-ray scattering
• Local electronic structure of molecular solids of low-Z elements (e.g., biomaterials) investigated by high resolution near-edge X-ray Raman scattering
• Phase transitionsunderhigh-pressure, low and high temperatures
• Materials science usinghigh-resolution X-ray absorption and emissionspectroscopy
• X-ray physics and optics

• X-ray absorption spectroscopy
• Powder X-ray diffraction
• High resolution X-ray scattering
• Protein crystallography

• Surface structural analysis
• Atomic-scale structural analysis of a crystal surface, an ultra-thin film and a nanostructure
• Analysis of nanostructures grown at a vacuum/solid, liquid/solid, and solid/solid interface
• Analysis of local structures using microdiffraction.

• Materials science at high pressure
• Surface/interface analysis
• XAFS
• Pair-distribution function (PDF) analysis
• Time-resolved energy-dispersive XAFS (DXAFS)

• XAFS in wide energy region (3.8 to 72 keV)
• XAFS of dilute systems and thin films
• Time resolved XAFS by quick scan

• Highly precise characterization of advanced materials
• High energy excitation X-ray photoelectron spectroscopy
• Highly preciseX-ray powder diffraction

• Characterization of thin films for ULSI, optical and magnetic devices, secondary batteries, fuel cells, catalysts, functional materials, and structural materials.

• Characterization of industrial materials, such as metal and oxide films, semiconductor crystals, etc., by XAFS, topography and other methods

• High resolution photoemission spectroscopy --- A2 station
  Angle-resolved photoemission (ARPES) study using soft X-rays to observe 'bulk' band structure
  In situ ARPES measurement on strongly-correlated transition-metal oxide thin films fabricated by laser MBE method
• Spectroscopic photoemission low energy electron microscopy --- Ac station
  SPELEEM has the top of the world standard spatial resolving power.
  Variable 3 different imaging modes (real space imaging, reciprocal space imaging and energy dispersion mode), and 3 different excitation sources (highly brilliant circularly polarized soft x-ray, electron beam and Hg mercury lamp) are available.
• Soft X-ray emission spectroscopy for liquid and biological samples --- A3 station
  Study of the electronic structure of liquid and biological samples by soft X-ray emission spectroscopy
• Soft x-ray diffraction spectroscopy --- B1 station
  Soft x-ray diffraction on the ordered materials to study the electronic structure
• Carry-in station --- Bc station
  Free space where users can carry in their own instruments. Focused soft x-ray beam is available.

• This beamline is open for any research field requiring the highly brilliant X-ray beam

• Residual stress measurement, and structural analysis of thin film, surface and interface
• Powder diffraction
• X-ray imaging, X-ray topography
• Small angle X-ray scattering (Ultra-small angle scattering)

• Micro-imaging
  Hard X-ray microbeam/scanning microscopy, imaging microscopy, micro-tomography, phase-contrast microtomography with Bonse-Hart interferometer, X-ray holography, coherent X-ray optics, and other experiments on X-ray optics and developments of optical elements
• Medical application
  Micro-angiography, refraction-enhanced imaging, radiation therapy, phase-contrast CT using interferometer
• Ultra-small angle scattering

• The medical research mainly involves micro-radiography, micro-tomography and refraction-contrast imaging on biological specimens and small animals
• Imaging techniques involve the evaluation and development of various kinds of optical elements for novel imaging techniques

• Materials science at high pressure
• Resonant X-ray scattering (activity at RI laboratory)
• Residual stress measurement

• Surface chemistry with supersonic molecular beam
• Biophysical spectroscopy
• Photoelectron spectroscopy (activity at RI laboratory)
• Magnetic circular dichroism (activity at RI laboratory)

• Structure analysis of small bio-crystals for industry
• Crystallographic analysis of metallic materials for industry (surface analysis, strain measurements)
• x-ray microscopic application for industry (micro- or nano-beam, high-resolution imaging)

• Research on electronic states and band structures by photoemission spectroscopy (PES) and angle-resolved photoemission spectroscopy (ARPES)
• Analysis of atomic arrangements by photoelectron diffraction (PED)
• Analysis of magnetic domains, local electronic states and magnetic dynamics by photoemission electron microscope (PEEM)
• Research on element-specific magnetic states by X-ray magnetic circular dichroism (XMCD), analysis of magnetic states using soft X-ray nano-beam

• Structural genomics research based on single crystal X-ray diffraction

• B-branch: high-energy soft X-ray spectroscopy and microscopy
  Si(111) channel-cut double crystal monochromator（2.1～3.3 keV）
  Soft X-ray photoabsorption spectroscopy of dilute samples
  X-ray fluorescence analysis of light elements
  Scanning X-ray microscopy using soft X-ray micro-beam
• C-branch: low-energy soft X-ray spectroscopy
  Valid-line-spacing plane grating monochromator（0.17～2.2 keV）
  Soft X-ray photoabsorption spectroscopy of dilute sample
  Soft X-ray photoabsorption spectroscopy under the normal atmospheric pressure condition
  Electronic structures analysis using soft x-ray emission spectrometer

• White X-ray diffraction and topography
• Time-resolved energy-dispersive XAFS (DXAFS) for studies of chemical and/or physical reaction process.
• Biomedical imaging and radiation biology studies.
• High energy (~200 keV) X-ray microtomography

• Analysis of rechargeable batteries.
• In situ, time-resolved and microbeam.
• X-ray diffraction (XRD) and X-ray Absorption Fine Structure (XAFS), Hard X-ray photoelectron spectroscopy (HAXPES).

• X-ray optics, especially coherent X-ray optics

• Production of high intensity GeV photon beam by laser-backward Compton scattering
• Hadron physics via photo-nucleon and photo-nuclear reactions
• Test and calibration of detectors with GeV gamma-ray and converted electrons/positrons

 BL32B2 RIKEN

• Structural biology
• X-ray crystallography
• Micro crystallography

• Analysis and evaluation of materials used in car industry, time-resolved XAFS

• Meson photoproduction from nucleon and nucleus
• Photoexcitation of hyperons, nucleon resonances, and other exotic states
• Photonuclear reactions
• Beam diagnoses
• Test and calibration of detectors with GeV photon beam

• Dynamics of materials on meV energy scales: Phonons, Excitations in Liquids and Glasses
• Methods of investigation include inelastic X-ray scattering (IXS) and nuclear resonant scattering (NRS).
• Focal spot size of φ20 microns possible with KB setup

• Real time analysis of catalytic reaction dynamics for fuel cells
• Analysis methods
  Time resolved XAFS
  2D spatial resolved XAFS
  Depth resolved XAFS
  3D laminography XAFS
  Ambient pressure hard X-ray photoelectron spectroscopy

• X-ray spectrochemical analysis using micro/nano beam
• Ultra trace element analysis
• High energy X-ray fluorescence analysis

• Routine data collection for macromolecular crystallography

• Accelerator science
• Accelerator beam diagnostics
• R&D of accelerator components
• Production of MeV γ-ray photons

• X-ray magnetic circular dichroism (XMCD) spectroscopy
• Element-specific magnetometry (ESM)
• X-ray emission spectroscopy (XES) and its magnetic circular dichroism
• Resonant X-ray magnetic scattering for multilayers
• XMCD and XAFS microscopy and local ESM with a 100-300 nm spatial resolution
• XAFS and XMCD at high pressure (0-100 GPa @ room temperature, 0-20 GPa @ low temperature)
• X-ray spectroscopy using variable X-ray polarization

• Fast time-resolved x-ray diffraction and scattering
• X-ray photon correlation spectroscopy
• Fluorescence analysis
• Microbeam X-ray diffraction and scattering
• Time-resolved quick XAFS

• Noncrystalline small and wide angle X-ray scattering

• Macromolecular crystallography
• Ultra-high resolution structure analysis
• Micro-crystallography

• Infrared microspectroscopy

• Electronic Excitations and Atomic Dynamics

• Crystal structure analysis of biological macromolecular assemblies (e.g. membrane protein complexes, protein complexes, protein-nucleic acid complexes, and viruses)

• Structure-based Materials Science

• SAXS-station: Time-resolved structures of non-crystalline biological materials such as protein, nucleic acid solutions, membrane, muscle, and micelle system under various conditions, are studied by using small-angle scattering and diffraction technique.
• SWAXS-station: Wide-scale structural analysis for nano- and meso-strucure in soft-condensed matters such as polymer, lipid and complex fluid systems are investigated by using small- and wide-angle X-ray scattering/diffraction techniques.

• Structural characterization of thin film by X-ray diffraction and X-ray reflectivity measurement
• Residual stress measurement
• Time resolved X-ray diffraction
• Hard X-ray Photoemission Spectroscopy

• Hard X-ray Photoelectron Spectroscopy 
• Projection type micro-tomography
• Imaging type micro-tomography
• Hard X-ray microbeam/scanning microscopy