• XAFS in wide energy region (3.8 to 113 keV)
• XAFS of dilute systems and thin films
• Time resolved XAFS by quick scan

• Charge density study by single crystal X-ray diffraction
• Crystal structure analysis of micro single crystal
• Investigation of phase transition under external field

• Charge density studies closely related to properties of functional materials
• Structural aspects of phase transition
• Ab initio structure determination using powder diffraction data
• Structural refinements by Rietveld method
• In-situ powder diffraction experiment under gas and vapor adsorption/desorption

• Research development of organic or polymer materials as thin files, fiber, bulk, film, and solution.
• Structural analysis of materials using X-ray scattering measurements.
• X-ray measurement for polymer thin film or organic thin film
• Innovations in the manufacturing process for soft and polymer materials.
• Observation on a structure changing under a controlled environment by real-time X-ray measurement with a large processing apparatus
• Observation of a change in the hierarchal structure at Å~µm scale by simultaneous measurement

• In-situ X-ray measurements under high pressure and high temperature conditions using large-volume press and resistance heating
• Energy dispersive X-ray diffraction measurements (2θ = 3-16°/ 20-150 keV)
• Angle dispersive X-ray diffraction measurements (30-60 keV/ 2θ = <10°)
• X-ray absorption imaging
• Elastic velocity measurements under extreme conditions

• Structure analysis of glass, liquid, and amorphous materials
• High energy X-ray diffraction measurements (61, 113 keV)

• Structural analysis by small- and wide- angle X-ray scattering
• R&D of SR instruments

• Solid State Physics
• Physical Chemistry
• Applied Chemistry
• Applied Physics

• Magnetic Compton scattering
• High-resolution Compton scattering
• High-energy Bragg scattering
• High-energy fluorescent X-ray analysis
• Time-resolved pair distribution function analysis (PDF)

• XAFS in a wide energy region
• Small angle X-ray scattering
• X-ray topography
• Imaging
• X-ray diffraction for multipurpose

• Electronic properties at the buried interface with high energy resolution
• Element and orbital specific electronic state using the tunable photon energy
• Three-dimensional spatial resolved analysis of the chemical states using the combination micro focusing beam and angle-resolved measurement
• X-ray polarization tunability with phase retarder and analysis for observing magnetic effects
• Various applications both in basic and applied research fields under low temperatures

• Structure analysis and phase transitions under ultra high pressure (DAC experiment)
• Earth and planetary science

• Nuclear Resonant Scattering
• Surface and interface structure with MBE
• Resonant inelastic X-ray scattering
• X-ray Emission Spectroscopy

• Elementary electronic excitations, quasiparticle behaviors, and electron-correlation effects in correlated electron systems investigated usinghigh resolution non-resonantorresonant inelastic X-ray scattering
• Local electronic structure of molecular solids of low-Z elements (e.g., biomaterials) investigated by high resolution near-edge X-ray Raman scattering
• Phase transitionsunderhigh-pressure, low and high temperatures
• Materials science usinghigh-resolution X-ray absorption and emissionspectroscopy
• X-ray physics and optics

• X-ray absorption spectroscopy
• Powder X-ray diffraction
• High resolution X-ray scattering
• Protein crystallography

• Material structural analysis, process observation
• Atomic-scale structural analysis of a thin film, bulk materials and a nanostructure
• Analysis of local structures using nanodiffraction

• Materials science at high pressure
• XAFS
• Time-resolved energy-dispersive XAFS (DXAFS)

• X-ray imaging
• XAFS in wide energy region (3.8 to 72 keV)
• XAFS of dilute systems and thin films
• Time resolved XAFS by quick scan

BL15XU RIKEN Materials Science III

• Hard X-ray Photoelectron Spectroscopy, X-ray diffraction, X-ray microbeam analysis, X-ray Fluorescence analysis / Analysis of industrial materials and devices

• XAFS, X-ray diffraction, X-ray imaging, Topography / Analysis of industrial materials and devices

• Scanning soft x-ray spectromicroscope --- A3 station
  Microspectroscopic observation of sample surface under conditions
  ranging from low vacuum to helium atmosphere.
  X-ray fluorescence analysis, elemental distribusion mapping near-edge
  x-ray absorption fine-structure measurements for local area are available.
• Carry-in station --- Bc station
  Free space where users can carry in their own instruments. Focused soft x-ray beam is available.
  By using versatile photoemission electron microscope,electronic / magnetic states imaging (resolving power : better than 100 nm) and its time-resolved measurements

• This beamline is open for any research field requiring the highly brilliant X-ray beam

• Residual stress measurement, and structural analysis of thin film, surface and interface
• Powder diffraction
• X-ray topography
• Small angle X-ray scattering (Ultra-small angle scattering)

• X-ray micro-/nano-imaging: micro-CT, nano-CT (15-37.7 keV), refraction/phase contrast imaging, X-ray diffraction tomography (XRD-CT), microbeam/scanning x-ray microscope
• Research and development of X-ray optics and optical elements, coherent X-ray optics
• Ultra small-angle X-ray scattering (USAXS, 23 keV)

• The medical research mainly involves micro-radiography, micro-tomography and refraction-contrast imaging on biological specimens and small animals
• Imaging techniques involve the evaluation and development of various kinds of optical elements for novel imaging techniques

• XAFS
• HAXPES
• Residual stress measurement
• X-ray diffraction and x-ray absorption under high temperature and high pressure
• Atomic pair distribution function (PDF) measurements under hydrogen atmosphere and ordinary pressure
• Coherent x-ray diffraction, resonant x-ray diffraction, etc.

• Surface chemistry with supersonic molecular beam
• Photoelectron spectroscopy
• Magnetic circular dichroism
• Biophysical spectroscopy

• Microbeam small- and wide-angle X-ray scattering for local structure analysis.
• Scanning and imaging microscope, micro-tomography, coherent diffraction.
• Microbeam X-ray diffraction and bright field X-ray topography for electronic device materials.

• Research on electronic states and band structures by photoemission spectroscopy (PES) and angle-resolved photoemission spectroscopy (ARPES)
• Analysis of atomic arrangements by photoelectron diffraction (PED)
• Research on element-specific magnetic states by X-ray magnetic circular dichroism (XMCD), analysis of magnetic states using soft X-ray nano-beam

• Structural biology research based on single crystal X-ray diffraction

• Structural biology research based on single crystal X-ray diffraction

• B-branch: high-energy soft X-ray spectroscopy and microscopy
  Si(111) channel-cut double crystal monochromator（2.1～3.3 keV）
  Soft X-ray photoabsorption spectroscopy of dilute samples
  X-ray fluorescence analysis of light elements
  Scanning X-ray microscopy using soft X-ray micro-beam
• C-branch: low-energy soft X-ray spectroscopy
  Valid-line-spacing plane grating monochromator（0.17～2.2 keV）
  Soft X-ray photoabsorption spectroscopy of dilute sample
  Soft X-ray photoabsorption spectroscopy under the normal atmospheric pressure condition
  Electronic structures analysis using soft x-ray emission spectrometer

• White X-ray diffraction and topography
• Time-resolved energy-dispersive XAFS (DXAFS) for studies of chemical and/or physical reaction process.
• Biomedical imaging and radiation biology studies.
• High energy (~200 keV) X-ray microtomography

• In-situ and time-resolved analyses of rechargeable batteries
• Resonance x-ray diffraction
• X-ray diffraction spectroscopy (XDS)
• Hard x-ray photoemission spectroscopy (HAXPES)

• X-ray optics, especially coherent X-ray optics

• Production of high intensity GeV photon beam by laser-backward Compton scattering
• Hadron physics via photo-nucleon and photo-nuclear reactions
• Test and calibration of detectors with GeV gamma-ray and converted electrons/positrons

BL32B2 R&D-BM

• X-ray diffraction
• X-ray absorption fine structure
• R&D of SR instruments

• Structural biology
• X-ray crystallography
• Micro crystallography

• XAFS, X-ray Small Angle Scattering, Imaging, X-Ray Diffraction, Scanning 3D-XRD Microscope / Automotive Related Materials

• Meson photoproduction from nucleon and nucleus
• Photoexcitation of hyperons, nucleon resonances, and other exotic states
• Photonuclear reactions
• Beam diagnoses
• Test and calibration of detectors with GeV photon beam

• High-resolution inelastic X-ray Scattering (IXS)
  Dynamics of materials on meV energy scales: Phonons, Excitations in Liquids and Glasses
• Nuclear Resonant Scattering (NRS)
  Electronic property studied by Mössbauer spectroscopy (NFS/EDMS) using synchrotron radiation
  Atomic or molecular dynamics using nuclear resonant inelastic scattering in meV region and using quasi-elastic scattering in neV-µeV region (TDI, Rayleigh Scattering)

• Time-resolved QXAFS using tapered-Undulator beam
• full-field/scanning XAFS imaging
• XES
• simultaneous time-resolved QXAFS/XRD
• ambient pressure HAXPES
• pink beam experiment

• X-ray spectrochemical analysis using micro/nano beam
  Scanning X-ray microspectroscopy
• X-ray spectroscopic imaging
  Projection type spectroscopic tomography
  Imaging type spectroscopic tomography
• Ultra trace element analysis
• High energy X-ray fluorescence analysis

• Small Angle X-ray Scattering

• Accelerator science
• Accelerator beam diagnostics
• R&D of accelerator components

• X-ray magnetic circular dichroism (XMCD) spectroscopy
• Element-specific magnetometry (ESM)
• X-ray emission spectroscopy (XES) and its magnetic circular dichroism
• Resonant X-ray magnetic scattering for multilayers
• XMCD and XAFS microscopy and local ESM with a 100-300 nm spatial resolution
• XAFS and XMCD at high pressure (0-100 GPa @ room temperature, 0-40 GPa @ low temperature)
• X-ray spectroscopy using variable X-ray polarization

• Fast time-resolved x-ray diffraction and scattering
• X-ray photon correlation spectroscopy
• Fluorescence analysis
• Microbeam X-ray diffraction and scattering
• Micro-crystallography

• Noncrystalline small and wide angle X-ray scattering

• Macromolecular crystallography
• Micro-crystallography
• Ultra-high resolution structure analysis

• Infrared microspectroscopy

• Electronic Excitations and Atomic Dynamics

• Crystal structure analysis of biological macromolecular assemblies (e.g. membrane protein complexes, protein complexes, protein-nucleic acid complexes, and viruses)

• Structural analysis of periodic and aperiodic systems by total scattering

• Macromolecular crystallography
• Micro-crystallography
• Automation & High throughput data collection for protein crystallography

• Structural characterization of thin film by X-ray diffraction and X-ray reflectivity measurement
• Residual stress measurement
• Time resolved X-ray diffraction
• Hard X-ray Photoemission Spectroscopy
• X-ray Imaging

• Projection type micro-tomography
• Imaging type micro-tomography
• Hard X-ray microbeam/scanning microscopy